The properties of nickel in silicon.
Active Ni centers properties in Si with emphasis on increasing and reducing minority carrier lifetime in silicon integrated circuits, discussing energy levels
Ghandhi, S. K.↗
Engineering topics
Thiel, F. L.
Publications and source records attributed to Thiel, F. L..
Pulse noise immunity in saturated logic gates.
Pulse noise immunity of saturated logic gates assessed to determine operational reliability
Ghandhi, S. K.↗
Study in optimization of microcircuit design Final report
Optimization of microcircuit reliability
MICROCIRCUIT↗