Thurlow, P.

Submillisecond Optical Knife-Edge Testing

Fast computer-controlled sampling of optical knife-edge response (KER) signal increases accuracy of optical system aberration measurement. Submicrosecond-response detectors in optical focal plane convert optical signals to electrical signals converted to digital data, sampled and feed into computer for storage and subsequent analysis. Optical data are virtually free of effects of index-of-refraction gradients.