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Tischler, Jonathan Zachary

Publications and source records attributed to Tischler, Jonathan Zachary.

7 records
All sourcesNASA NTRSDOE OSTI
DOE OSTI2014

Crystal structures and optical properties of new quaternary strontium europium aluminate luminescent nanoribbons

We report the synthesis and characterizations of three series of quaternary strontium europium aluminate (Sr-Eu-Al-O; SEAO) luminescent nanoribbons that show blue, green, and yellow luminescence from localized Eu2+ luminescent centers. These three series of SEAO nanoribbons are: blue luminescent, tetragonal Sr1-xEuxAl6O10 (0 1-x Eu x Al 2 O 4 (0 1-x Eu x Al 2 O 4 (0<x<1) (y-SEAO). Among these three series of SEAO nanoribbons, the b-SEAOs and y-SEAOs are new compounds that have not been reported before. The crystal structures of the SEAO nanoribbons were comprehensively studied using various synchrotron X-ray diffraction techniques and the effects of crystal structures on materials’ luminescence properties were investigated. These one-dimensional SEAO luminescent nanoribbons can function as both light generators and waveguides, and thus have promising potential as the building blocks in miniaturized photonic circuitry.

36 MATERIALS SCIENCE↗
DOE OSTI2012

Phase-Specific Elastic/Plastic Interface Interactions in Layered Cr-NiAl Structures

The depth-dependent, as-grown and deformation-induced strain and dislocations partitioned through the interfaces in a two-phase layered NiAl-Cr(Mo) structure are directly measured at the mesoscale using 3-D X-ray microdiffraction. It is demonstrated that in the as-grown, undeformed state, neighboring submicron Cr solid solution and NiAl eutectic lamellae (doped with {approx}3% Mo) form a heterointerface with 180{sup o} rotation around a <1 1 2> pole. It is shown that the mechanical response to the indentation of a layered composite with alternating Cr(Mo)-NiAl lamellae is distinct from the response of single-phase materials. In the center of the indent, after the load is released, the NiAl lamellae are under compressive forward stresses (with the same sign as the indentation-induced compression) while Cr solid solution lamellae are under tensile back stresses (with opposite sign from the indentation load). The depth-dependent alternation of compressive/tensile residual strains in the neighboring Cr solid solution and NiAl lamellae is understood in the framework of the Mughrabi's composite model considering two types of structure elements: harder and softer regions. Under indentation, both kinds of lamellae are assumed to deform compatibly. After the load is released, residual forward stresses are formed in the harder lamellae, and back stresses are formed in the mechanically softer lamellae. Line-broadening analysis of the intensity distribution along the diffraction vector reveals a 15-times increase in dislocation density in the near-surface zone in the center of the indent. Such a large increase is typical for severe deformation.

36 MATERIALS SCIENCE↗
DOE OSTI2012

Validating classical line profile analyses using microbeam diffraction from individual dislocation cell walls and cell interiors

Dislocation structures in deformed metals produce broad asymmetric diffraction line profiles. During analysis, these profiles are generally separated into two nearly symmetric subprofiles corresponding to diffraction by dislocation cell walls and cell interiors. These subprofiles are then interpreted using complex models of dislocation-based line broadening. Until now, it has not been possible to test the many assumptions that are made in such an analysis. Here, depth-resolved microbeam diffraction was used to measure diffraction line profiles from numerous individual dislocation cell walls and cell interiors in a heavily deformed Cu single crystal. Summing these profiles directly constructed the cell-interior and cell-wall subprofiles that have been approximated in the line profile analysis literature for the past 30 years. Direct comparison between the reconstructed subprofiles and the macroscopic asymmetric line profile from the same sample allows the first direct tests of many of the assumptions that have been used for interpreting these X-ray measurements.

36 MATERIALS SCIENCE↗