Engineering topics
Publications and source records attributed to Titus, J..
The relative importance of heavy-ion interaction with the oxide, charge ionized in the epilayer, and charge ionized in the drain substrate, on the bias for SEGR failure is experimentally investigated.
This effort is a detailed analysis of existing microelectronics and photonics test bed satellite data from one experiment, the bipolar test board, looking to improve our understanding of the enhanced low dose rate sensitivity (ELDRS) phenomenon. Over the past several years, extensive total dose irradiations of bipolar devices have demonstrated that many of these devices exhibited ELDRS. In sensitive bipolar transistors, ELDRS produced enhanced degradation of base current, resulting in enhanced gain degradation at dose rates <0.1 rd(Si)/s compared to similar transistors irradiated at dose rates >1 rd(Si)/s. This Technical Publication provides updated information about the test devices, the in-flight experiment, and both flight-and ground-based observations. Flight data are presented for the past 5 yr of the mission. These data are compared to ground-based data taken on devices from the same date code lots. Information about temperature fluctuations, power shutdowns, and other variables encountered during the space flight are documented.
A fuze assembly, which consists of three major parts, nose, collar and sleeve, was designed to survive severe transverse impact giving a maximum base acceleration of 20.000 G. It is shown that hoop failure occurred in the collar after the impact. They also showed that by bonding the collar to the nose, the collar was able to survive the same impact. To find out the effectiveness of the bonding quantitatively, axisymmetric solid elements TRAPAX and TRIAAX were used in modelling the fuze and direct transient analysis was performed. The dynamic stresses in selected elements on the bonded and unbonded collars were compared. The peak hoop stresses in the unbonded collar were found to be up to three times higher than those in the bonded collar. The NASTRAN results explained the observed hoop failure in the unbonded collar. In addition, static and eigenvalue runs were performed as checks on the models prior to the transient runs. The use of the MPCAX cards and the existence and contributors of the calculated first several nearly identical natural frequencies are addressed.