Investigation of Computational Corrections to X-Ray Computed Tomography for Dimensional Metrology of Complex Additively Manufactured Parts
X-ray computed tomography (CT) is a nondestructive evaluation technique that may be used to image complex internal features without the line-of-sight restrictions inherent in conventional optical and contact (stylus) metrology instrumentation. Applications of CT metrology include material defects (porosity), dimensions and surface texture. However, scan artifacts, such as streaking, caused primarily by beam hardening and scatter, limit the accuracy of CTbased metrology. Reduction of these artifacts would improve the accuracy material properties and dimensional metrology information. This paper reports on the development of additively manufactured (AM) Ti5553 and 316L measurement phantoms with integral lattice (lattice) structures specifically designed to exhibit these artifacts. The phantoms were scanned in three CT systems and a scanning-probe CMM measurement. Surfaces generated from uncorrected CT data exhibited “dimple” defects that are not present in the CMM measurement. Correction methods were developed in Livermore Tomography Tools (LTT) software and this paper reports on the successful correction of these artifacts. This work is expected to have application in areas where characterization of defects, dimensions and surface texture using CT are critical.