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Tran, Vu

Publications and source records attributed to Tran, Vu.

4 records
All sourcesNASA NTRSDOE OSTI
DOE OSTI2024

FY2024 Q4 L2 Milestone 8237 for Opacity-on-NIF

This document addresses parts 2 and 3 of the original milestone request. In the following writeup, the development of OpSpecTR at LLNL by LLNL and NNSS personnel will be detailed first, followed by a write-up of the development of Vme-resolved simulaVons of the opacity-on-NIF experiment. Capsule backlight simulaVons, hohlraum simulaVons, and sample simulaVons from CASSIO are combined to produce the line of sight from the capsule to an effecVve OpSpec posiVon. Spectra are generated by post-processing these simulaVons from either Spect3D, a commercial software by Prism ComputaVonal Sciences, or FESTR (Finite Element Spectroscopic Transport of RadiaVon), a LANL code. While the simulaVons do not at this stage proceed late enough to include the worst of the backgrounds generated from the hohlraum experimentally and each post-processing simulaVon includes only one ray for each spectrometer channel, these efforts represent proof of concept for a new capability to complete Vme-resolved and Vmegated simulaVons for the complete line of sight of the complex opacity-on-NIF geometry. Future work will be discussed at the end of the report for both efforts.

42 ENGINEERING↗
DOE OSTI2021

Electrical conductivity of Sn at high pressure and temperature

To date, temperature and conductivity have many outstanding implications in extreme environments but are yet to be fully understood under high pressure and temperature dynamic conditions. Here, we introduce an approach to provide high quality electrical conductivity results under dynamic loading conditions. Emphasis is given to address the skin depth effect's influence in a dynamic loading experiment by using thin films. The thin film samples in this study were at least 100 times thinner than previous samples in dynamic electrical conductivity experiments, increasing the current density to its full potential across the sample's entire cross section. Consideration of the skin depth accounts for at minimum a 4× scaling factor to the final electrical conductivity result that has been neglected in previous dynamic electrical conductivity studies. We also obtained improved signal-to-noise ratio with custom diagnostics optimized for better electrical impedance matching. Furthermore, these considerations were applied to Sn to assess electrical conductivity at elevated pressure and temperature. The high signal-to-noise ratio with reduced skin depth influence results in Sn allowing observation of the conductivity changes related to solid-to-solid and solid-to-liquid phase transitions. Additionally, we calculate the Sn thermal conductivity using the Wiedemann-Franz law for our experiments and compare against thermal transport dependent temperature measurements from previous work.

36 MATERIALS SCIENCE↗