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Trivedi, Shubhendu [Fermilab] (ORCID:0000000312374301)

Publications and source records attributed to Trivedi, Shubhendu [Fermilab] (ORCID:0000000312374301).

Strong Lensing Cosmology with Population-level Calibrated Neural Ratio Estimation

Strong gravitational lensing contains key information about cosmic acceleration. Modern and next-generation galaxy imaging surveys are expected to provide high-quality data on $\mathcal{O}(10^5)$ galaxy-galaxy lensing systems. The plethora and complexity of the data are likely to present computational challenges for parameter inference methods for fitting high-dimensional likelihoods, which are often analytically intractable. Neural Ratio Estimation (NRE) efficiently computes individual likelihood ratios that can be combined into population-level posteriors. We use simulations to study the capacity of NRE to jointly predict the dark energy equation-of-state parameter $w$ and the total matter density $Ω_{m}$ from lensing images and companion spectroscopic information. We also introduce a post hoc posterior coverage calibration procedure that mitigates the model overconfidence that is typically found in neural density estimation applications. Our experiments show that the errors on both parameters decrease with increasing inference population sizes. In particular, for 100 lenses in a standard $Λ$CDM Universe, our calibrated NRE model achieves median fractional uncertainty of $22.8\%$ in $w$ and $2.9\%$ in $Ω_{m}$. This proof of concept demonstrates a potentially scalable approach for efficient cosmological parameter inference with large populations of galaxy-scale lenses observed in future surveys.

Jarugula, Sreevani [Fermilab] (ORCID:0000000253867↗

Automating Sensor Characterization with Bayesian Optimization

The development of novel instrumentation requires an iterative cycle with three stages: design, prototyping, and testing. Recent advancements in simulation and nanofabrication techniques have significantly accelerated the design and prototyping phases. Nonetheless, detector characterization continues to be a major bottleneck in device development. During the testing phase, a significant time investment is required to characterize the device in different operating conditions and find optimal operating parameters. The total effort spent on characterization and parameter optimization can occupy a year or more of an expert's time. In this work, we present a novel technique for automated sensor calibration that aims to accelerate the testing stage of the development cycle. This technique leverages closed-loop Bayesian optimization (BO), using real-time measurements to guide parameter selection and identify optimal operating states. We demonstrate the method with a novel low-noise CCD, showing that the machine learning-driven tool can efficiently characterize and optimize operation of the sensor in a couple of days without supervision of a device expert.

Cuevas-Zepeda, Julian [Chicago U., KICP; Chicago U↗