Scanless laser waveform measurement in the near-infrared
Field-resolved measurements of few-cycle laser waveforms allow access to ultrafast electron dynamics in light–matter interactions and are key to future lightwave electronics. Recently, sub-cycle gating based on nonlinear excitation in active pixel sensors has allowed the first single-shot measurements of mid-infrared optical fields. Extending the techniques to shorter wavelengths, however, is not feasible using silicon-based detectors with bandgaps in the near-infrared. Here, we demonstrate an all-optical sampling technique for near-infrared laser fields, wherein an intense fundamental field generates a sub-cycle gate through nonlinear excitation of a wide-bandgap crystal, in this case, ZnO, which can sample the electric field of a weak perturbing pulse. By using a crossed-beam geometry, the temporal evolution of the perturbing field is mapped onto a transverse spatial axis of the nonlinear medium, and the waveform is captured in a single measurement of the spatially resolved fluorescence emission from the crystal. The technique is demonstrated through field-resolved measurements of the field reshaping during nonlinear propagation in the ZnO detection crystal.