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Tuggle, Jay

Publications and source records attributed to Tuggle, Jay.

Growth of Nb 3 Sn coating in tin vapor-diffusion process

The potential of Nb 3 Sn for superconducting radio frequency (SRF) cavities is widely recognized and renewed R&D efforts continue to bring new insights about the material's structure and properties. Here, we have systematically coated niobium with Nb 3 Sn for different durations, and several of them were coated over ("overcoat") multiple times, to elucidate the growth kinetics of Nb 3 Sn during tin vapor diffusion process. Analysis of coated samples is consistent with the model in which tin diffuses via grain boundaries to the Nb 3 Sn-Nb interface, where the growth of Nb 3 Sn into the Nb bulk takes place. Similar scaling laws were found for Nb 3 Sn grain growth and layer thickness. Non-parabolic layer growth is consistent with significant grain growth, which reduces the number of Sn transport channels. Examination of patchy region in Nb 3 Sn coating, revealing large single crystalline grains, points to impeded Nb 3 Sn layer growth due to low grain boundary density, resulting in a significantly thinner coating in those areas.

36 MATERIALS SCIENCE↗

Electron backscatter diffraction of Nb 3 Sn coated niobium: Revealing structure as a function of depth

Over the last two decades, advances in Electron Backscatter Diffraction (EBSD) have moved the technique from a research tool to an essential characterization technique in many fields of material research. EBSD is the best suited technique for determining structure as a function of depth. This characterization is critically important, but has been previously absent from Nb 3 Sn efforts. While EBSD is the technique of choice, obtaining quality data can be difficult. Sample preparation in particular is non-trivial. Here we summarize the general principles of EBSD, discuss specific sample preparation techniques for Nb 3 Sn coated SRF cavity material, and give examples of how EBSD is being used to understand fundamental growth mechanisms for Nb 3 Sn coatings.

36 MATERIALS SCIENCE↗

Nb3Sn growth on niobium in vapor diffusion process and its application to large RF surface

Nb3Sn-coated SRF cavities can potentially achieve superior performance in terms of quality factor, accelerating gradient, and operating temperature. Tin vapor diffusion process of Nb3Sn coating on Nb is a simple, yet efficacious technique to fabricate Nb3Sn-coated SRF cavities. The process comprises two¬ steps: ?nucleation? followed by ?deposition?. The crucible with Sn/SnCl2 and the substrate at a constant temperature of about 500 °C for several hours is the ?nucleation?; the crucible and the substrate at a constant temperature, typically, above 1000 °C is the ?deposition? step. Using custom-built sample coating chamber, we have coated over a hundred samples to systematically study the vapor diffusion process under varying process conditions and at different stages of the coating process. The surfaces, thus obtained, were investigated with surface studies techniques, such as SEM/EDS, AFM, XPS, SAM, SIMS, EBSD and TEM. Based on the experimental results, we will discuss nucleation and growth of Nb3Sn coating during vapor diffusion process.

Pudasaini, Uttar↗

Secondary ion mass spectrometry for superconducting radiofrequency cavity materials

Historically, many advances in superconducting radio frequency (SRF) cavities destined for use in advanced particle accelerators have come empirically, through the iterative procedure of modifying processing and then performance testing. However, material structure is directly responsible for performance. Understanding, the link between processing, structure, and performance will streamline and accelerate the research process. In order to connect processing, structure, and performance, accurate and robust materials characterization methods are needed. Here in this paper, one such method, SIMS, is discussed with focus on analysis of SRF materials. In addition, several examples are presented, showing how SIMS is being used to further understanding of materials based SRF technologies.

43 PARTICLE ACCELERATORS↗

Investigation of Nitrogen Absorption Rate and Nitride Growth on SRF Cavity Grade RRR Niobium as a Function of Furnace Temperature

The current state of the art processing of niobium superconducting radio frequency cavities with nitrogen diffusion is performed at 800 C in a furnace with a partial pressure of approximately ~20 mTorr of nitrogen. Multiple studies have shown the bulk of the nitrogen absorbed by the niobium forms a thick (1-3 microns) non-superconducting nitride layer which must be removed to produce optimal RF results. The depth profiling of interstitial nitrogen and surface nitrides has already been probed using SIMS measurements for this recipe. These measurements have been successfully modelled by extrapolating data from nitride growth studies performed at atmospheric pressure and temperatures above 1000 C.1 One open question is whether there is a diffusion-only zone at lower temperature in the ~20 mTorr range in which the niobium will absorb nitrogen but not create a non-superconducting nitride layer; or is the absorption of nitrogen only possible by first forming a nitride buffer layer which then frees up nitrogen for absorption which is what has been shown down to 600 C at atmospheric pressures on long time scales. A systematic study of absorption vs. temperature and correlated SIMS measurements is required to answer this question. We report on measurements of the parabolic rate constant vs. temperature from 400 C to 900 C of cavity grade niobium with metallurgically flat witness samples. Depth profiles of witness samples using SIMS are presented together with SEM imaging for nitride crystals and correlated with N absorption.

Reece, Charles↗

Investigation of Low-Level Nitrogen in Niobium by Secondary Ion Mass Spectrometry

Understanding the improvement of the SRF cavity quality factor by low-level nitrogen addition (?N-doping?) is attracting much attention from researchers. Precise, repeatable measurement of the nitrogen profile in the parts-per-thousand to parts-per-million range is vital. Secondary Ion Mass Spectrometry (SIMS) is the approach of choice because of excellent sensitivity and depth resolution. Accurate quantitation must consider sample properties, such as surface topography and crystal structure, calibration of the instrument with reference materials, and data analysis. We report the results of a SIMS study in which polycrystal and single crystal coupons were N-doped, each accompanied by new SRF-grade niobium sheet equivalent to a single cell cavity.

Tuggle, Jay↗

Progress With Multi-Cell Nb3Sn Cavity Development Linked With Sample Materials Characterization

Exploiting both the new Nb3Sn coating system and the materials characterization tools nearby, we report our progress in low-loss Nb3Sn films development. Nb3Sn films a few micrometers thick were grown on Nb coupons as well as single- and multi-cell cavities by the Sn-diffusion technique. Films structure and composition were investigated on coated samples and cavity cutouts with characterization tools including SEM/EDS/EBSD, AFM, XPS, SIMS towards correlating film growth and RF loss to material properties and deposition parameters. Cavity coating efforts focused on establishing techniques for coating progressively more complicated RF structures, and understanding limiting mechanisms in coated cavities. Nb3Sn coated 1.5 GHz 1-cell and 1.3 GHz 2-cell cavities have shown quality factors of 1010 at 4.3 K, with several cavities reaching above Eacc = 10 MV/m. The dominant limiting mechanisms were low field quenches and quality factor degradation above 8 MV/m. The surface data indicates a near-stoichiometric Nb3Sn consistent with the transition temperature and gap measurements. The Nb3Sn layer is covered with Nb2O5 and SnO2 native oxides and has little memory of the pre-coating surface.

Eremeev, Grigory V.↗

Structure and composition of Nb3Sn diffusion coated films on Nb

The structure and composition of Nb3Sn films obtained by diffusion coating niobium coupons and SRF cavities were investigated by x-ray photoelectron spectroscopy (XPS), secondary ion mass spectroscopy (SIMS) and scanning electron microscopy (SEM) with energy-dispersive x-ray spectroscopy (EDS) and electron back-scatter diffraction (EBSD), including native surfaces, depth profiles and cross-sections. We find that the native surface oxide is significantly tin-rich, we have measured depth profiles. We find that the grains apparent in the SEM images are individual crystallites having no evident relationship to the substrate or each other.

Tuggle, Jay↗