Microelectronics on the Applications Technology Satellite.
Reliability, handling and packaging of microelectronic submodules used in integrated circuits on Applications Technology Satellite
Van Allen, R. L.↗
Engineering topics
Publications and source records attributed to Van Allen, R. L..
Reliability, handling and packaging of microelectronic submodules used in integrated circuits on Applications Technology Satellite
Phenomenological study of radiation damage and recovery of metal oxide semiconductor field effect transistors
Fabrication, packaging, and testing of microelectronic equipment for Applications Technology Satellite /ATS/ scientific experimental package
Phenomenological study of radiation damage and recoverability of metal oxide field effect transistors
Description of instrumentation on the explorer xii satellite to digitize, store and read out the data obtained from cosmic ray detection equipment