Radiation induced degradation of SOI n-channel LDMOSFETs
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silicon on insulator SOI↗
Engineering topics
Vandooren, A.
Publications and source records attributed to Vandooren, A..
Hot-carrier reliability of transistors fabricated by a 0.25-mu m fully depleted SOI CMOS process
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SOI reliability hot carrier↗
Hot-carrier reliability of transistors fabricated by a 0.25-mu m fully depleted SOI CMOS process
In the present work, the hot-carrier degradation of transistors fabricated by a 0.25- mu m FD SOI CMOS process was investigated.
SOI reliability hot carrier↗
Evaluation of the Sensitivity of Newly Emerging FD-SOI Technologies to Low Temperature and Radiation Environment in Space
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SOI Low Temperature Radiation↗
Evaluation of the Sensitivity of Newly Emerging FD-SOI Technologies to the Combined Low Temperature and Radiation Environment in Space
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temperature↗
FD-SOI Transistors at Low Temperatures
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SOI Low Temperature↗