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Walko, L. C.

Publications and source records attributed to Walko, L. C..

Full scale lightning test technique

A test technique was developed for applying a full scale mean value (30 kiloampere peak) simulated lightning return stroke current on a complete flight ready aircraft to assess the threat of lightning to aircraft electrical circuits. A computer-aided generator design was used to establish the parameters of the test system. Data from previous work done on development of low inductance current paths determined the basic system configuration.

Walko, L. C.

Lightning effects on the NASA F-8 digital-fly-by-wire airplane

The effects of lightning on a Digital Fly-By-Wire (DFBW)aircraft control system were investigated. The aircraft was a NASA operated F-8 fitted with a modified Apollo guidance computer. Current pulses similar in waveshape to natural lightning, but lower in amplitude, were injected into the aircraft. Measurements were made of the voltages induced on the DFBW circuits, the total current induced on the bundles of wires, the magnetic field intensity inside the aircraft, and the current density on the skin of the aircraft. Voltage measurements were made in both the line-to-ground and line-to-line modes. Voltages measured at the non-destructive test level were then scaled upward to determine how much would be produced by actual lightning. A 200,000 ampere severe lightning flash would produce between 40 and 2000 volts in DFBW circuits. Some system components are expected to be vulnerable to these voltages.

Plumer, J. A.

Preliminary tests of vulnerability of typical aircraft electronics to lightning-induced voltages

Tests made on two pieces of typical aircraft electronics equipment to ascertain their vulnerability to simulated lightning-induced transient voltages representative of those which might occur in flight when the aircraft is struck by lightning were conducted. The test results demonstrated that such equipment can be interfered with or damaged by transient voltages as low as 21 volts peak. Greater voltages can cause failure of semiconductor components within the equipment. The results emphasize a need for establishment of coordinated system susceptibility and component vulnerability criteria to achieve lightning protection of aerospace electrical and electronic systems.

Plumer, J. A.

A test technique for measuring lightning-induced voltages on aircraft electrical circuits

The development of a test technique used for the measurement of lightning-induced voltages in the electrical circuits of a complete aircraft is described. The resultant technique utilizes a portable device known as a transient analyzer capable of generating unidirectional current impulses similar to lightning current surges, but at a lower current level. A linear relationship between the magnitude of lightning current and the magnitude of induced voltage permitted the scaling up of measured induced values to full threat levels. The test technique was found to be practical when used on a complete aircraft.

Walko, L. C.