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Wallentine, Mark

Publications and source records attributed to Wallentine, Mark.

Using SPC and Trending to Reduce FOD

This paper presents viewgraphs showing the trends and Statistical Process Control (SPC) used by ATK-Thiokol to reduce Foreign Object Debris (FOD). Some of the topics include: 1) Amazing Little Known and Less Used Facts; 2) Critical Nature of Rocket Manufacturing; 3) ATK-Thiokol Foreign Object Debris (FOD) Philosophy; 4) FOD Trending and SPC at ATK-Thiokol Philosophy; 5) Trending and Statistical Process Control (SPC) Basic Philosophy; 6) Trending and Statistical Process Control (SPC); 7) FOD Trending and SPC at ATK-Thiokol Trending; 8) FOD Trending and SPC at ATK-Thiokol Specific Instances; 9) FOD Trending and SPC at ATK-Thiokol Contamination in Air; and 10) FOD Trending and SPC at ATK-Thiokol Nitrogen Dewpoint.

Wallentine, Mark↗