Determination of the Poisson ratio of (001) and (111) oriented thin films of In{sub 2}O{sub 3} by synchrotron-based x-ray diffraction
The Poisson ratio {nu} of In{sub 2}O{sub 3} has been determined by measurement of the covariation of in-plane and out-of-plane lattice parameters of strained thin films grown epitaxially on (111) and (001) oriented cubic Y-stabilized ZrO{sub 2} substrates. The experimental results are in good agreement with values for {nu} calculated using atomistic simulation procedures.