Weyl, G. M. | Search NASA

NASA NTRS1992

Arcing of negatively biased solar cells in low earth orbit

A set of experiments is described in which the arcing of negatively biased solar cells is examined and characterized in terms of the primary factors that cause such behavior. The experiments are conducted in an ultrahigh vacuum chamber, and an image-intensified CCD camera is employed to monitor UV emission from arc events at the interfacial edge between the cover slip and the solar cell. A bead of encapsulant along the interfacial edge is noted which can be removed to reduce arc frequency, and water contamination is found to further enhance arcing. Frequency of arcing is found to vary indirectly with temperature and directly with exposure to H2O, but no other significant correlations are noted. The sensitivity to H2O vapor is eliminated by simply removing the adhesive/encapsulant, and the corresponding arc-rate performance is low.

Upschulte, B. L.↗

NASA NTRS1991

Significant reduction in arc frequency biased solar cells: Observations, diagnostics, and mitigation technique(s)

A variety of experiments were performed which identify key factors contributing to the arcing of negatively biased high voltage solar cells. These efforts have led to reduction of greater than a factor of 100 in the arc frequency of a single cell following proper remediation procedures. Experiments naturally lead to and focussed on the adhesive/encapsulant that is used to bond the protective cover slip to the solar cell. An image-intensified charge coupled device (CCD) camera system recorded UV emission from arc events which occurred exclusively along the interfacial edge between the cover slip and the solar cell. Microscopic inspection of this interfacial region showed a bead of encapsulant along this entire edge. Elimination of this encapsulant bead reduced the arc frequency by two orders of magnitude. Water contamination was also identified as a key contributor which enhances arcing of the encapsulant bead along the solar cell edge. Spectrally resolved measurements of the observable UV light shows a feature assignable to OH(A-X) electronic emission, which is common for water contaminated discharges. Experiments in which the solar cell temperature was raised to 85 C showed a reduced arcing frequency, suggesting desorption of H2O. Exposing the solar cell to water vapor was shown to increase the arcing frequency. Clean dry gases such as O2, N2, and Ar show no enhancement of the arcing rate. Elimination of the exposed encapsulant eliminates any measurable sensitivity to H2O vapor.

Upschulte, B. L.↗