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Williams, D. B.

Publications and source records attributed to Williams, D. B..

17 records
All sourcesNASA NTRSDOE OSTI
NASA NTRS1994

High-Performance X-ray Detection in a New Analytical Electron Microscope

X-ray detection by energy-dispersive spectrometry in the analytical electron microscope (AEM) is often limited by low collected X-ray intensity (P), modest peak-to-background (P/B) ratios, and limitations on total counting time (tau) due to specimen drift and contamination. A new AFM has been designed with maximization of P. P/B, and tau as the primary considerations. Maximization of P has been accomplished by employing a field-emission electron gun, X-ray detectors with high collection angles, high-speed beam blanking to allow only one photon into the detector at a time, and simultaneous collection from two detectors. P/B has been maximized by reducing extraneous background signals generated at the specimen holder, the polepieces and the detector collimator. The maximum practical tau has been increased by reducing specimen contamination and employing electronic drift correction. Performance improvments have been measured using the NIST standard Cr thin film. The 0-3 steradian solid angle of X-ray collection is the highest value available. The beam blanking scheme for X-ray detection provides 3-4 times greater throughput of X-rays at high count rates into a recorded spectrum than normal systems employing pulse-pileup rejection circuits. Simultaneous X-ray collection from two detectors allows the highest X-ray intensity yet recorded to be collected from the NIST Cr thin film. The measured P/B of 6300 is the highest level recorded for an AEM. In addition to collected X-ray intensity (cps/nA) and P/B measured on the standard Cr film, the product of these can be used as a figure-of-merit to evaluate instruments. Estimated minimum mass fraction (MMF) for Cr measured on the standard NIST Cr thin film is also proposed as a figure-of-merit for comparing X-ray detection in AEMs. Determinations here of the MMF of Cr detectable show at least a threefold improvement over previous instruments.

Lyman, C. E.↗
NASA NTRS1993

The microstructure and formation of duplex and black plessite in iron meteorites

Two of the most common plessite structures, duplex and black plessite, in the taenite region of the Windmanstatten pattern of two iron meteorites (Grant and Carlton) are characterized using high-resolution electron microscopy and microanalysis techniques. Two types of gamma precipitates, found in the duplex plessite and black plessite regions, respectively, are identified, and their morphologies are described. The formation of the plessite structure is discussed using the information obtained in this study and results of a parallel investigation of decomposed martensitic Fe-Ni laboratory alloys.

Zhang, J.↗
NASA NTRS1993

Preliminary AEM study of the microstructure and composition of metal particles in ordinary chondrites

The purpose of this study is to examine the microstructure and composition of the metal particles in ordinary chondrites using analytical electron microscopy (AEM) techniques. Since the phases produced within the metal particles are very fine, the application of various AEM techniques for structural and chemical characterization is critical. However, thin specimen preparation for AEM study has proven very difficult because of the matrix silicate which is present. This is the first AEM study of the metal particles in chondrites. A type 6 chondrite, Saint Severin (LL6), was selected for examination because the metal phases have been reheated into the single phase taenite region (greater than 700 C), and cooled slowly to lower temperatures. A combination of electron optical instruments was employed including a field emission gun (FEG) JEOL 840F high resolution scanning electron microscope (HRSEM), a JEOL 6300F FEG-HRSEM, a Philips 400T AEM, and a JEOL 733 electron probe microanalyzer (EPMA).

Yang, C. W.↗
NASA NTRS1992

X-Ray Microanalysis and Electron Energy Loss Spectrometry in the Analytical Electron Microscope: Review and Future Directions

This paper reviews and discusses future directions in analytical electron microscopy for microchemical analysis using X-ray and Electron Energy Loss Spectroscopy (EELS). The technique of X-ray microanalysis, using the ratio method and k(sub AB) factors, is outlined. The X-ray absorption correction is the major barrier to the objective of obtaining I% accuracy and precision in analysis. Spatial resolution and Minimum Detectability Limits (MDL) are considered with present limitations of spatial resolution in the 2 to 3 microns range and of MDL in the 0.1 to 0.2 wt. % range when a Field Emission Gun (FEG) system is used. Future directions of X-ray analysis include improvement in X-ray spatial resolution to the I to 2 microns range and MDL as low as 0.01 wt. %. With these improvements the detection of single atoms in the analysis volume will be possible. Other future improvements include the use of clean room techniques for thin specimen preparation, quantification available at the I% accuracy and precision level with light element analysis quantification available at better than the 10% accuracy and precision level, the incorporation of a compact wavelength dispersive spectrometer to improve X-ray spectral resolution, light element analysis and MDL, and instrument improvements including source stability, on-line probe current measurements, stage stability, and computerized stage control. The paper reviews the EELS technique, recognizing that it has been slow to develop and still remains firmly in research laboratories rather than in applications laboratories. Consideration of microanalysis with core-loss edges is given along with a discussion of the limitations such as specimen thickness. Spatial resolution and MDL are considered, recognizing that single atom detection is already possible. Plasmon loss analysis is discussed as well as fine structure analysis. New techniques for energy-loss imaging are also summarized. Future directions in the EELS technique will be the development of new spectrometers and improvements in thin specimen preparation. The microanalysis technique needs to be simplified and software developed so that the EELS technique approaches the relative simplicity of the X-ray technique. Finally, one can expect major improvements in EELS imaging as data storage and processing improvements occur.

Goldstein, J. I.↗
NASA NTRS1992

Definition of the Spatial Resolution of X-Ray Microanalysis in Thin Foils

The spatial resolution of X-ray microanalysis in thin foils is defined in terms of the incident electron beam diameter and the average beam broadening. The beam diameter is defined as the full width tenth maximum of a Gaussian intensity distribution. The spatial resolution is calculated by a convolution of the beam diameter and the average beam broadening. This definition of the spatial resolution can be related simply to experimental measurements of composition profiles across interphase interfaces. Monte Carlo calculations using a high-speed parallel supercomputer show good agreement with this definition of the spatial resolution and calculations based on this definition. The agreement is good over a range of specimen thicknesses and atomic number, but is poor when excessive beam tailing distorts the assumed Gaussian electron intensity distributions. Beam tailing occurs in low-Z materials because of fast secondary electrons and in high-Z materials because of plural scattering.

Williams, D. B.↗
NASA NTRS1992

An APFIM/AEM Study of Phase Decompositions in Fe-Ni Alloys at Low Temperatures

A combined atom probe field ion microscopy and analytical electron microscopy characterization has been performed on laboratory aged martensitic and austenitic specimens of FeNi and FeNiP alloys. These techniques revealed that the martensitic 24.1 and 28.6 at.% Ni alloys decomposed during aging for 1 year at 300 C to form face centered cubic precipitates of approx. 56 at.% Ni in a body centered cubic matrix containing approx. 20 at.% Ni. Some thin platelets were observed in the field ion micrographs of the austenitic Fe-42.9 at. % Ni alloy and the Fe-43.2 at.% Ni-0.44 at.% P alloy after aging at 400 and 350 C. Atom probe analysis revealed phosphorus clustering in the ternary alloy aged at 300 C.

Zhang, J.↗
NASA NTRS1991

The structure and composition of metal particles in two type 6 ordinary chondrites

The microstructure and composition of taenite particles were examined in two type-6 ordinary chondrites, Kernouve (H6) and Saint Severin (LL6), using reflected light microscopy and a combination of electron optical instruments. It was found that, in both meteorites, the taenite particles consisted of a narrow rim of high-Ni taenite and a central region of cloudy zone similar to those present in iron meteorites. The microstructure of the cloudy zone in Saint Severin was coarser than that in Kernouve , due to the higher Ni content and slower cooling rate of the former. Three microstructural zones were observed in the outer taenite rim of both meteorites, the origin of which is considered likely to be due to the presence of ordered domain boundaries or to the presence of two phases FeNi and FeNi3 in the high-Ni region of the outer taenite rim.

Holland-Duffield, C. E.↗
NASA NTRS1990

Electron microscopy study of the iron meteorite Santa Catharina

A characterization of the microstructural features of Santa Catharina (SC) from the millimeter to submicron scale is presented. The same specimen was examined using an optical microscope, a scanning electron microscope, an electron probe microanalyzer, and an analytical electron microscope. Findings include the fact that SC metal nodules may have different bulk Ni values, leading to different microstructures upon cooling; that SC USNM 6293 is the less corroded sample, as tetrataenite exists as less than 10 nm ordered domains throughout the entire fcc matrix (it is noted that this structure is the same as that of the Twin City meteorite and identical to clear taenite II in the retained taenite regions of the octahedrites); that SC USNM 3043 has a more complicated microstructure due to corrosion; and that the low Ni phase of the cloudy zone was selectively corroded in some areas and formed the dark regions, indicating that the SC meteorite corrosion process was electrochemical in nature and may involve Cl-containing akaganeite.

Zhang, J.↗
NASA NTRS1989

Ordering in the Fe-Ni system under electron irradiation

The disorder-order transformation was generated in a range of Fe-Ni alloys using 1 MeV electrons in a high voltage electron microscope. The experimental factors that influence the occurrence of the transformation were determined, and the critical disordering temperature, Tc, was determined as a function of composition. It was demonstrated that the irradiation enhanced the ordering reaction kinetics. A metastable, ordered phase transformation was not induced. From the results, it is possible to deduce new information about the Fe-Ni phase diagram below 350 C.

Reuter, K. B.↗
NASA NTRS1989

Determination of the Fe-Ni phase diagram below 400 C

Analytical EM techniques have been used to obtain a phase diagram for the Fe-Ni system below 400 C in the composition range from 0-52 wt pct Ni. The present diagram is consistent with all the phases observed in the Fe-Ni regions of meteorites. An asymmetric spinodal decomposition results in the expected two-phase isotropic microstructure. The present experimentally-determined miscibility gap below 400 C, located between 11.7 and 51.9 wt pct Ni at 200 C, is shown to be wider than the calculated miscibility gap.

Reuter, K. B.↗
NASA NTRS1989

The Hole-Count Test Revisited: Effects of Test Specimen Thickness

For historical reasons the hole count, an important performance test for the Analytical Electron Microscope (AEM), is somewhat arbitrary yielding different numbers for different investigators. This was not a problem a decade ago when AEM specimens were often bathed with large fluxes of stray electrons and hard x rays. At that time the presence or absence of a thick Pt second condenser (C2) aperture could be detected by a simple comparison of the x-ray spectrum taken 'somewhere in the hole' with a spectrum collected on a 'typical thickness' of Mo or Ag foil. A high hole count of about 10-20% indicated that the electron column needed modifications; whereas a hole count of 1-2% was accepted for most AEM work. The absolute level of the hole count is a function of test specimen atomic number, overall specimen shape, and thin-foil thickness. In order that equivalent results may be obtained for any AEM in any laboratory in the world, this test must become standardized. The hole-count test we seek must be as simpl and as nonsubjective as the graphite 0.344nm lattice-line-resolution test. This lattice-resolution test spurred manufacturers to improve the image resolution of the TEM significantly in the 1970s and led to the even more stringent resolution tests of today. A similar phenomenon for AEM instruments would be welcome. The hole-count test can also indicate whether the spurious x-ray signal is generated by high-energy continuum x rays (bremsstrahlung) generated in the electron column (high K-line to L-line ratio) or uncollimated electrons passing through or around the C2 aperture (low K/L ratio).

Lyman, C. E.↗
NASA NTRS1988

Low temperature phase transformations in the metallic phases of iron and stony-iron meteorites

The nickel content and the structure of kamacite and decomposed taenite (clear taenite 1, CT-1; the cloudy zone, CZ; and clear taenite 2, CT-2) in the metallic phases of meteorites were determined using X-ray microanalysis techniques in the AEM. The kamacite near the CT-1 interface was found to contain about 4 wt pct Ni. The CT-1 structure contains 51.4-45.6 wt pct Ni; it is ordered FeNi with the L1(0) superstructure. The CZ structure consists of two phases: a globular phase (ordered FeNi containing 50.9 wt pct Ni) and a surrounding honeycomb martensitic phase containing 11.7 wt pct Ni. The CT-2 was found in all of the iron meteorite groups studied and in the pallasites, but not in the mesosiderites. Based on the preliminary evidence, this region is believed to be ordered Fe3Ni. Possible mechanisms for the decomposition of taenite are discussed.

Reuter, K. B.↗
NASA NTRS1988

Formation of the lamellar structure in Group IA and IIID iron meteorites

Analytical EM, light microscopy, and electron microprobe analysis are used to study the lamellar plessite structure of Group IA and IIID iron meteorites. The alpha lamellae in IIID structures contained a compositional gradient from 6.1 + or - 0.7 wt pct Ni at the center of the alpha lamellae to 3.6 + or - 0.5 wt pct at the alpha/gamma interface. For the Group IA irons, compositions of 4 wt pct Ni in alpha and about 48 wt pct Ni in gamma are found. Convergent beam electron diffraction was used to characterize the orientation relations at the alpha/gamma interface in the lamellar regions of both Group IA and IIID. The phase transformations responsible for the observed lamellar structure in the IA and IIID chemical groups were also investigated.

Kowalik, J. A.↗
NASA NTRS1982

Analytical electron microscope study of eight ataxites

Optical and electron optical (SEM, TEM, AEM) techniques were employed to investigate the fine structure of eight ataxite-iron meteorites. Structural studies indicated that the ataxites can be divided into two groups: a Widmanstaetten decomposition group and a martensite decomposition group. The Widmanstaetten decomposition group has a Type I plessite microstructure and the central taenite regions contain highly dislocated lath martensite. The steep M shaped Ni gradients in the taenite are consistent with the fast cooling rates, of not less than 500 C/my, observed for this group. The martensite decomposition group has a Type III plessite microstructure and contains all the chemical group IVB ataxites. The maximum taenite Ni contents vary from 47.5 to 52.7 wt % and are consistent with slow cooling to low temperatures of not greater than 350 C at cooling rates of not greater than 25 C/my.

Novotny, P. M.↗
NASA NTRS1980

Electron-optical observations of ordered FeNi in the Estherville meteorite

Electron optical studies of the ordered FeNi (taenite) phase in the Estherville meteorite are reported. A thin section of the meteorite containing a large area of continuous anisotropic taenite was studied by crossed polar reflected light microscopy, and electron probe microanalysis, transmission electron microscopy, scanning transmission electron microscopy and X-ray energy dispersive spectrometry. Results reveal the presence of preferentially ion-etched regions of clear taenite corresponding to single crystals, with superlattice reflections in the fundamental FeNi reciprocal lattice arising from long-range ordering. The presence of antiphase domain boundaries within the regions also confirms the presence of ordering. It is thus proposed that clear taenite in the Estherville meteorite contains regions of ordered FeNi phase in a disordered gamma-phase matrix.

Mehta, S.↗