Engineering topics

Wohlgemuth, John

Publications and source records attributed to Wohlgemuth, John.

10 records

DOE OSTI2018

Marrying Quality Assurance with Design Engineering - A Winning Partnership! But, a Cultural Divide

Investors would like to be confident that a PV plant will work as promised before investing large sums of money. Data showing that PV modules can withstand thousands of hours of accelerated testing are a comfort, but are not sufficient to characterize the economic useful life (EUL) of the whole PV system. An inability to be confident of every aspect of the system can motivate less favorable contract terms. In the end, a winning partnership is obtained when a carefully engineered, durable design is married with a robust quality management system and the marriage is extended across all parts of the value chain. However, this marriage is challenging because of the conventional cultural divide between design engineers and quality management specialists. International standards are being developed to facilitate this partnership and include technology-specific requirements in the quality management systems used for component manufacture and system design, construction and operation.

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DOE OSTI2018

Marrying Quality Assurance with Design Engineering - A Winning Partnership! But, a Cultural Divide?: Preprint

Investors would like to be confident that a PV plant will work as promised before investing large sums of money. Data showing that PV modules can withstand thousands of hours of accelerated testing are a comfort, but are not sufficient. An inability to be confident of every aspect of the system can motivate higher interest rates; high degradation or failure rates can substantially decrease the return on investment and the value of the plant for resale later on. In the end, a winning partnership is obtained when a carefully engineered, durable design is married with a robust quality management system and the marriage is extended across all parts of the value chain. However, this marriage is challenging because of the conventional cultural divide between design engineers and quality management specialists. This paper discusses the motivation for increased emphasis on quality assurance and describes three new standards that detail requirements for a higher level of quality assurance for 1) PV module manufacturing, 2) inverter and other balance-of-systems (BOS) manufacturing, and 3) control of the system installation and operation. The paper concludes with a discussion of the challenges and benefits of marrying the quality assurance program with further optimization of the PV system design.

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DOE OSTI2018

Potential-Induced Degradation-Delamination Mode in Crystalline Silicon Modules: Preprint

A test sequence producing potential-induced degradation-delamination (PID-d) in crystalline silicon modules has been tested and found comparable under visual inspection to cell/encapsulant delamination seen in some fielded modules. Four commercial modules were put through this sequence, 85 degrees C, 85%, 1000 h damp heat, followed by an intensive PID stress sequence of 72 degrees C, 95% RH, and -1000 V, with the module face grounded using a metal foil. The 60 cell c-Si modules exhibiting the highest current transfer (4.4 center dot 10-4 A) exhibited PID-d at the first inspection after 156 h of PID stress. Effects promoting PID-d are reduced adhesion caused by damp heat, sodium migration further reducing adhesion to the cells, and gaseous products of electrochemical reactions driven by the applied system voltage. A new work item proposal for an IEC test standard to evaluate for PID-d is anticipated.

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DOE OSTI2017

Qualification Testing Versus Quantitative Reliability Testing of PV - Gaining Confidence in a Rapidly Changing Technology: Preprint

Continued growth of PV system deployment would be enhanced by quantitative, low-uncertainty predictions of the degradation and failure rates of PV modules and systems. The intended product lifetime (decades) far exceeds the product development cycle (months), limiting our ability to reduce the uncertainty of the predictions for this rapidly changing technology. Yet, business decisions (setting insurance rates, analyzing return on investment, etc.) require quantitative risk assessment. Moving toward more quantitative assessments requires consideration of many factors, including the intended application, consequence of a possible failure, variability in the manufacturing, installation, and operation, as well as uncertainty in the measured acceleration factors, which provide the basis for predictions based on accelerated tests. As the industry matures, it is useful to periodically assess the overall strategy for standards development and prioritization of research to provide a technical basis both for the standards and the analysis related to the application of those. To this end, this paper suggests a tiered approach to creating risk assessments. Recent and planned potential improvements in international standards are also summarized.

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DOE OSTI2017

Streamlining the Bankability Process using International Standards

NREL has supported the international efforts to create a streamlined process for documenting bankability and/or completion of each step of a PV project plan. IECRE was created for this purpose in 2014. This poster describes the goals, current status of this effort, and how individuals and companies can become involved.

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DOE OSTI2017

Failure Analysis to Identify Thermal Runaway of Bypass Diodes in Fielded Modules

We studied a bypass diode recuperated from fielded modules in a rooftop installation to determine the failure mechanism. The field-failed diode showed similar characteristics to thermal runaway, specifically X-ray tomography evidence of migrated metal. We also observed burn marks on the silicon surface like those lab-stressed for thermal runaway. Reaction products are more soluble than silicon and the surface is oxygen rich.

14 SOLAR ENERGY↗

DOE OSTI2016

Modeling Current Transfer from PV Modules Based on Meteorological Data

Current transferred from the active cell circuit to ground in modules undergoing potential-induced degradation (PID) stress is analyzed with respect to meteorological data. Duration and coulombs transferred as a function of whether the module is wet (from dew or rain) or the extent of uncondensed surface humidity are quantified based on meteorological indicators. With this, functions predicting the mode and rate of coulomb transfer are developed for use in estimating the relative PID stress associated with temperature, moisture, and system voltage in any climate. Current transfer in a framed crystalline silicon module is relatively high when there is no condensed water on the module, whereas current transfer in a thin-film module held by edge clips is not, and displays a greater fraction of coulombs transferred when wet compared to the framed module in the natural environment.

14 SOLAR ENERGY↗

DOE OSTI2016

Comparative Study of 28 and 18 Years Field Aged Siemens-Arco M55 Modules in Temperate and Hot-Dry Climates

The primary objective of this research work is two-fold: (i) determine the degradation rates of Siemens-Arco M55 modules exposed over 18 and 28 years in a hot-dry climate of Arizona and a temperate climate of California, and; (ii) identify the potential modes responsible for these degradation losses. The degradation rates were determined based on the I-V data obtained on exposed modules and on the corresponding control modules which were not exposed in the fields. The degradation modes responsible for these degradations were determined using several nondestructive tests and destructive tests performed on these control and exposed modules. The nondestructive tests included: current-voltage, visual inspection, cell-module quantum efficiency, and module level reflectance spectroscopy. The destructive tests included: transmittance spectroscopy of glass superstrates, and FTIR, DSC and TGA of encapsulant materials.

14 SOLAR ENERGY↗

DOE OSTI2016

Elucidating PID Degradation Mechanisms and In Situ Dark I–V Monitoring for Modeling Degradation Rate in CdTe Thin-Film Modules

A progression of potential-induced degradation (PID) mechanisms are observed in CdTe modules, including shunting/junction degradation and two different manifestations of series resistance depending on the stress level and water ingress. The dark I-V method for in-situ characterization of Pmax based on superposition was adapted for the thin-film modules undergoing PID in view of the degradation mechanisms observed. An exponential model based on module temperature and relative humidity was fit to the PID rate for multiple stress levels in chamber tests and validated by predicting the observed degradation of the module type in the field.

14 SOLAR ENERGY↗

DOE OSTI2016

Investigation of a Wedge Adhesion Test for Edge Seals

Many photovoltaic (PV) technologies have been found to be sensitive to moisture that diffuses into a PV package. Even with the use of impermeable frontsheets and backsheets, moisture can penetrate from the edges of a module. To limit this moisture ingress pathway from occurring, manufacturers often use a low permeability polyisobutylene (PIB) based edge seal filled with desiccant to further restrict moisture ingress. Moisture ingress studies have shown that these materials are capable of blocking moisture for the 25-year life of a module; but to do so, they must remain well-adhered and free of cracks. This work focuses on adapting the Boeing Wedge test for use with edge seals laminated using glass substrates as part of a strategy to assess the long-term durability of edge seals. The advantage of this method is that it duplicates the residual stresses and strains that a glass/glass module may have when the lamination process results in some residual glass bending that puts the perimeter in tension. Additionally, this method allows one to simultaneously expose the material to thermal stress, humidity, mechanical stress, and ultraviolet radiation. The disadvantage of this method generally is that we are limited by the fracture toughness of the glass substrates that the edge seal is adhered to. However, the low toughness of typical uncrosslinked or sparsely crosslinked PIB makes them suitable for this technique. We present data obtained during the development of the wedge test for use with PV edge seal materials. This includes development of the measuring techniques and evaluation of the test method with relevant materials. We find consistent data within a given experiment, along with the theoretical independence of fracture toughness measurements with wedge thickness. This indicates that the test methodology is reproducible. However, even though individual experimental sets are consistent, the reproducibility between experimental sets is poor. We believe this may be due to inconsistencies in sample history, sample batch, or small changes in sample preparation/assembly from one month to the next. Because the fracture strength of typical edge seal materials is so low, they cannot be relied upon for mechanical strength. A small stress or strain on the edge seal is capable of promoting delamination or tearing causing the edge seal to fail. Because of this, edge seals are very dependent on the processing and construction parameters in the full size PV module such that any long term evaluation of their durability must be conducted on full size modules to be accurate.

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