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Yoon, Hongkyu

Publications and source records attributed to Yoon, Hongkyu.

35 records · Page 2
All sourcesNASA NTRSDOE OSTI
DOE OSTI2024

Progressive transfer learning for advancing machine learning-based reduced-order modeling

Abstract To maximize knowledge transfer and improve the data requirement for data-driven machine learning (ML) modeling, a progressive transfer learning for reduced-order modeling (p-ROM) framework is proposed. A key concept of p-ROM is to selectively transfer knowledge from previously trained ML models and effectively develop a new ML model(s) for unseen tasks by optimizing information gates in hidden layers. The p-ROM framework is designed to work with any type of data-driven ROMs. For demonstration purposes, we evaluate the p-ROM with specific Barlow Twins ROMs (p-BT-ROMs) to highlight how progress learning can apply to multiple topological and physical problems with an emphasis on a small training set regime. The proposed p-BT-ROM framework has been tested using multiple examples, including transport, flow, and solid mechanics, to illustrate the importance of progressive knowledge transfer and its impact on model accuracy with reduced training samples. In both similar and different topologies, p-BT-ROM achieves improved model accuracy with much less training data. For instance, p-BT-ROM with four-parent (i.e., pre-trained models) outperforms the no-parent counterpart trained on data nine times larger. The p-ROM framework is poised to significantly enhance the capabilities of ML-based ROM approaches for scientific and engineering applications by mitigating data scarcity through progressively transferring knowledge.

97 MATHEMATICS AND COMPUTING↗
DOE OSTI2024

Investigating the origin of the far-field reflection interference fringe (RIF) of microdroplets

We show that the reflection interference fringe (RIF) is formed on a screen far away from the microdroplets placed on a prism-based substrate, which have low contact angles and thin droplet heights, caused by the dual convex–concave profile of the droplet, not a pure convex profile. The geometric formulation shows that the interference fringes are caused by the optical path difference when the reflected rays from the upper convex profile at the droplet–air interface interfere with reflection from the lower concave profile at oblique angles lower than the critical angle. Analytic solutions are obtained for the droplet height and the contact angle out of the fringe number and the fringe radius in RIF from the geometric formulation. Furthermore, the ray tracing simulation is conducted using the custom-designed code. The geometric formulation and the ray tracing show excellent agreement with the experimental observation in the relation between the droplet height and the fringe number and the relation between the contact angle and the fringe radius. This study is remarkable as the droplet's dual profile cannot be easily observed with the existing techniques. However, the RIF technique can effectively verify the existence of a dual profile of the microdroplets in a simple setup. In this work, the RIF technique is successfully developed as a new optical diagnostic technique to determine the microdroplet features, such as the dual profile, the height, the contact angle, the inflection point, and the precursor film thickness, by simply measuring the RIF patterns on the far-field screen.

42 ENGINEERING↗