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Yu, Lihua

Publications and source records attributed to Yu, Lihua.

8 records
All sourcesNASA NTRSDOE OSTI
DOE OSTI2024

High Harmonic Generation Seeding Echo-Enabled Harmonic Generation toward a Storage Ring-Based Tender and Hard X-ray-Free Electron Laser

To align with the global trend of integrating synchrotron light source (SLS) and free electron laser (FEL) facilities on one site, in line with examples such as SPring-8 and SACLA in Japan and ELETTRA and FERMI in Italy, we actively explore FEL options leveraging the ultralow-emittance electron beam of the NSLS-II upgrade. These options show promising potential for synergy with storage ring (SR) operations, thereby significantly enhancing our facility’s capabilities. Echo-enabled harmonic generation (EEHG) is well-suited to SR-based FELs, and has already been demonstrated with the capability of generating extremely narrow bandwidth as well as high brightness, realized using diffraction-limited short pulses in transverse planes and Fourier transform-limited bandwidth in the soft X-ray spectrum. However, regarding a conventional EEHG scheme, the combination of the shortest seed laser wavelength (256 nm) and highest harmonic (200) sets the short wavelength limit to λ = 1.28 nm. To further extend the short wavelength limit down to the tender and hard X-ray region, a vital option is to shorten the seed laser wavelength. Thanks to recent advances in high harmonic generation (HHG), packing 10 9 photons at one harmonic within a few-femtosecond pulse could turn such a novel HHG source into an ideal seeding for EEHG. Thus, compared to the cascaded EEHG, the HHG seeding option could not only lower the cost, but also free the SR space for accommodating more user beamlines. Moreover, to mitigate the SASE background noise on the sample and detector, we combine the HHG seeding EEHG with the crab cavity short pulse scheme for maximum benefit.

36 MATERIALS SCIENCE↗
DOE OSTI2022

Current Status of Developing Ultrafast Mega-electron-volt Electron Microsope

Recent studies of ultrafast electron microscopy (UEM) techniques show the use of short bunches of relativistic electrons is promising for the development of a new instrument for imaging various materials. Compared to conventional electron microscopes, the main advantage of UEMs with the electron energy of a few MeV is the possibility to study thick samples. We will discuss the progress of UEM design to date, the principal challenges on the way to a high resolution, and possible methods for their mitigation including the design of low-aberration magnetic optics, RF and mechanical subsystems with high stability, and precise collimation of electrons scattered in the samples.

43 PARTICLE ACCELERATORS↗
DOE OSTI2019

A novel nondestructive diagnostic method for mega-electron-volt ultrafast electron diffraction

Abstract A real-time, nondestructive, Bragg-diffracted electron beam energy, energy-spread and spatial-pointing jitter monitor is experimentally verified by encoding the electron beam energy and spatial-pointing jitter information into the mega-electron-volt ultrafast electron diffraction pattern. The shot-to-shot fluctuation of the diffraction pattern is then decomposed to two basic modes, i.e., the distance between the Bragg peaks as well as its variation (radial mode) and the overall lateral shift of the whole pattern (drift mode). Since these two modes are completely decoupled, the Bragg-diffraction method can simultaneously measure the shot-to-shot energy fluctuation from the radial mode with 2·10 −4 precision and spatial-pointing jitter from the drift mode having wide measurement span covering energy jitter range from 10 −4 to 10 −1 . The key advantage of this method is that it allows us to extract the electron beam energy spread concurrently with the ongoing experiment and enables online optimization of the electron beam especially for future high charge single-shot ultrafast electron diffraction (UED) and ultrafast electron microscopy (UEM) experiments. Furthermore, real-time energy measurement enables the filtering process to remove off-energy shots, improving the resolution of time-resolved UED. As a result, this method can be applied to the entire UED user community, beyond the traditional electron beam diagnostics of accelerators used by accelerator physicists.

43 PARTICLE ACCELERATORS↗
DOE OSTI2019

A compact tunable quadrupole lens for brighter and sharper ultra-fast electron diffraction imaging

In this article, we report our proof-of-principle design and experimental commissioning of a broadly tunable and low-cost transverse focusing lens system for MeV-energy electron beams. The lens system based on electromagnetic (EM) quadrupoles has been built as a part of the existing instrument for ultra-fast electron diffraction (UED) experiments at the Accelerator Test Facility II (ATF-II) at Brookhaven National Laboratory (BNL). We experimentally demonstrated the independent control of the size and divergence of the beam with the charge ranging from 1 to 13 pC. The charge density and divergence of the beam at the sample are the most important factors determining the quality of the Bragg-diffraction image (BDI). By applying the Robust Conjugate Directional Search (RCDS) algorithm for online optimization of the quadrupoles, the transverse beam size can be kept constant down to 75 µm from 1 to 13 pC. The charge density is nearly two orders of magnitude higher than the previously achieved value using a conventional solenoid. Using the BDI method we were able to extract the divergence of the beam in real-time and apply it to the emittance measurement for the first time. Our results agree well with simulations and with the traditional quadrupole scan method. The real-time divergence measurement opens the possibility of online optimization of the beam divergence (< 0.2 mrad) at the sample with the increased beam charge. This optimization is crucial for the future development of single-shot ultra-fast electron microscope (UEM). Finally, we demonstrated BDI with significant improvement, up to 3 times higher peak intensity and 2 times sharper Bragg-diffraction peaks at 13 pC. The charge is now limited by the laser power and increasing charge may improve the quality of BDI further. The capability we demonstrated here provides us with opportunities for new sciences using near-parallel, bright and ultrafast electron beams for single-shot imaging, to directly visualize the dynamics of defects and nanostructured materials, or even record molecular movie, which are impossible using present electron-beam technologies.

43 PARTICLE ACCELERATORS↗