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Zuleeg, R.

Publications and source records attributed to Zuleeg, R..

SEU of complementary GaAs static RAMs due to heavy ions

The first measurement of single event upset (SEU) for complementary GaAs static RAMs caused by heavy ions is reported. Upset cross-sections of the circuits for 28 MeV oxygen ions are reported as well as the linear energy transfer (LET) threshold established by using 170 MeV oxygen ions at various angles of beam incidence.

Zuleeg, R.↗