Improving the Operational Lifetime of the CEBAF Photo-Gun by Anode Biasing
The operating lifetime of GaAs-based photocathodes in DC high voltage electron photo-guns is dominated by the ionization rate of residual beamline gas molecules. In this work, experiments were performed to quantify the improvement in photocathode charge lifetime by biasing the photo-gun anode with a positive voltage, which repels ions generated downstream of the anode. The photo-cathode charge lifetime improved by almost a factor of two when the anode was biased compared to the usual grounded configuration. Simulations were performed using the particle tracking code General Particle Tracer (GPT) with a new custom element. The simulation results showed that both the number and energy of ions play a role in the pattern of QE degradation. The experiment results and conclusions supported by GPT simulations will be presented.