@misc{indiciae40e48df55f9b,
  title = {Overlay copy technique to provide high-contrast electron micrographs for automatic metallographic analysis},
  author = {Cremens, W. S. and Norris, L. F. and Weeton, J. W.},
  year = {1966},
  url = {https://ntrs.nasa.gov/citations/19660028391},
  note = {Source identifier: 19660028391}
}