TY  - RPRT
TI  - Overlay copy technique to provide high-contrast electron micrographs for automatic metallographic analysis
AU  - Cremens, W. S.
AU  - Norris, L. F.
AU  - Weeton, J. W.
PY  - 1966
UR  - https://ntrs.nasa.gov/citations/19660028391
ID  - 19660028391
ER  -