TY  - RPRT
TI  - SiO2/Si interface states at 77 deg K
AU  - Caban-Zeda, H. P.
AU  - Greenstein, E.
AU  - Kuper, A. B.
PY  - 1967
UR  - https://ntrs.nasa.gov/citations/19670030532
ID  - 19670030532
ER  -