@misc{indiciae2f0457c1dd6d,
  title = {External visual inspection criteria for semiconductor devices},
  author = {Cole, C. G. and Hamiter, L. C., Jr. and Nowakowski, M. F.},
  year = {1966},
  url = {https://ntrs.nasa.gov/citations/19680010120},
  note = {Source identifier: 19680010120}
}