TY  - RPRT
TI  - Annealing effects in plated-wire memory elements. I - Interdiffusion of copper and Permalloy.
AU  - Knudson, C. I.
AU  - Kench, J. R.
PY  - 1971
UR  - https://ntrs.nasa.gov/citations/19720032049
ID  - 19720032049
ER  -