@misc{indiciae06c51868eb1f,
  title = {Accelerated test techniques for micro-circuits: Evaluation of high temperature (473 k - 573 K) accelerated life test techniques as effective microcircuit screening methods},
  author = {Johnson, G. M.},
  year = {1976},
  url = {https://ntrs.nasa.gov/citations/19760014491},
  note = {Source identifier: 19760014491}
}