TY  - RPRT
TI  - Accelerated test techniques for micro-circuits: Evaluation of high temperature (473 k - 573 K) accelerated life test techniques as effective microcircuit screening methods
AU  - Johnson, G. M.
PY  - 1976
UR  - https://ntrs.nasa.gov/citations/19760014491
ID  - 19760014491
ER  -