@misc{indiciaefcde94b0e07b,
  title = {Effective defect density for MOS breakdown - Dependence on oxide thickness},
  author = {Li, S. P. and Maserjian, J.},
  year = {1976},
  url = {https://ntrs.nasa.gov/citations/19760046878},
  note = {Source identifier: 19760046878}
}