TY  - RPRT
TI  - An optical profilometer for spatial characterization of three-dimensional surfaces
AU  - Kelly, W. L., IV
AU  - Burcher, E. E.
AU  - Skolaut, M. W., Jr.
PY  - 1977
UR  - https://ntrs.nasa.gov/citations/19770025514
ID  - 19770025514
ER  -