@misc{indiciaee27ece4856ea,
  title = {The effect of oxidation-expanded defects upon MOS parameters},
  author = {Prussin, S. and Li, S. P. and Cockrum, R. H.},
  year = {1977},
  url = {https://ntrs.nasa.gov/citations/19780031937},
  note = {Source identifier: 19780031937}
}