TY  - RPRT
TI  - Quantitative Analysis of Defects in Silicon
AU  - Natesh, R.
AU  - Smith, J. M.
AU  - Qidwai, H. A.
AU  - Bruce, T.
PY  - 1979
UR  - https://ntrs.nasa.gov/citations/19790023601
ID  - 19790023601
ER  -