TY  - RPRT
TI  - Capacitance transients in p-type GaAs MOS structures and application to lifetime mapping during solar cell fabrication
AU  - Vitale, G.
AU  - Loferski, J. J.
AU  - Ercil, Y.
PY  - 1979
UR  - https://ntrs.nasa.gov/citations/19790024497
ID  - 19790024497
ER  -