@misc{indiciae25b40243ceac,
  title = {Measuring radiation effects on MOS capacitors},
  author = {Bakowski, M. and Cockrum, R. H. and Maserjian, J. and Zamani, N.},
  year = {1980},
  url = {https://ntrs.nasa.gov/citations/19800000227},
  note = {Source identifier: 19800000227}
}