TY  - RPRT
TI  - Measuring radiation effects on MOS capacitors
AU  - Bakowski, M.
AU  - Cockrum, R. H.
AU  - Maserjian, J.
AU  - Zamani, N.
PY  - 1980
UR  - https://ntrs.nasa.gov/citations/19800000227
ID  - 19800000227
ER  -