@misc{indiciae97cebf54afce,
  title = {Radiation-induced defects in SiO2 as determined with XPS},
  author = {Grunthaner, F. J. and Grunthaner, P. J. and Maserjian, J.},
  year = {1982},
  url = {https://ntrs.nasa.gov/citations/19830036261},
  note = {Source identifier: 19830036261}
}