TY  - RPRT
TI  - Radiation-induced defects in SiO2 as determined with XPS
AU  - Grunthaner, F. J.
AU  - Grunthaner, P. J.
AU  - Maserjian, J.
PY  - 1982
UR  - https://ntrs.nasa.gov/citations/19830036261
ID  - 19830036261
ER  -