@misc{indiciae7f90ae770179,
  title = {An accelerated stress testing program for determining the reliability sensitivity of silicon solar cells to encapsulation and metallization systems},
  author = {Lathrop, J. W. and Davis, C. W. and Royal, E.},
  year = {1982},
  url = {https://ntrs.nasa.gov/citations/19840040343},
  note = {Source identifier: 19840040343}
}