@misc{indiciaeaa56721a46bf,
  title = {Electron escape depth variation in thin SiO2 films measured with variable photon energy},
  author = {Hecht, M. H. and Grunthaner, F. J. and Pianetta, P. and Johansson, L. I. and Lindau, I.},
  year = {1984},
  url = {https://ntrs.nasa.gov/citations/19840054798},
  note = {Source identifier: 19840054798}
}