TY  - RPRT
TI  - Electron escape depth variation in thin SiO2 films measured with variable photon energy
AU  - Hecht, M. H.
AU  - Grunthaner, F. J.
AU  - Pianetta, P.
AU  - Johansson, L. I.
AU  - Lindau, I.
PY  - 1984
UR  - https://ntrs.nasa.gov/citations/19840054798
ID  - 19840054798
ER  -