@misc{indiciaed3d7faaeda52,
  title = {A method of rapidly obtaining concentration-depth profiles from X-ray diffraction},
  author = {Wiedemann, K. E. and Unnam, J.},
  year = {1985},
  url = {https://ntrs.nasa.gov/citations/19850061101},
  note = {Source identifier: 19850061101}
}