@misc{indiciaea179ac9cc983,
  title = {Four-micron period ion-implanted bubble test circuits},
  author = {Nelson, T. J. and Fratello, V. J. and Muehlner, F. J. and Roman, B. J. and Slusky, S. E. G.},
  year = {1986},
  url = {https://ntrs.nasa.gov/citations/19860056447},
  note = {Source identifier: 19860056447}
}