TY  - RPRT
TI  - Design sensitivity analysis using EAL. Part 1: Conventional design parameters
AU  - Dopker, B.
AU  - Choi, Kyung K.
AU  - Lee, J.
PY  - 1986
UR  - https://ntrs.nasa.gov/citations/19870016939
ID  - 19870016939
ER  -