@misc{indiciae735c4033172f,
  title = {Dynamic dielectric analysis - A nondestructive cure process monitoring method},
  author = {Kranbuehl, D. E. and Delos, S. E. and Yi, E. C. and Mayer, J. T.},
  year = {1986},
  url = {https://ntrs.nasa.gov/citations/19870023466},
  note = {Source identifier: 19870023466}
}