TY  - RPRT
TI  - Verification of a SEU model for advanced 1-micron CMOS structures using heavy ions
AU  - Cable, J. S.
AU  - Carter, J. R.
AU  - Witteles, A. A.
PY  - 1986
UR  - https://ntrs.nasa.gov/citations/19870034744
ID  - 19870034744
ER  -