TY  - RPRT
TI  - Remote gate capacitance-voltage studies for noninvasive surface characterization
AU  - Chang, R. R.
AU  - Lile, D. L.
AU  - Gann, R.
PY  - 1987
UR  - https://ntrs.nasa.gov/citations/19880025115
ID  - 19880025115
ER  -