@misc{indiciaed402cec0d0a4,
  title = {Heavy ion induced Single Event Phenomena (SEP) data for semiconductor devices from engineering testing},
  author = {Nichols, Donald K. and Huebner, Mark A. and Price, William E. and Smith, L. S. and Coss, James R.},
  year = {1988},
  url = {https://ntrs.nasa.gov/citations/19890011450},
  note = {Source identifier: 19890011450}
}