TY  - RPRT
TI  - Heavy ion induced Single Event Phenomena (SEP) data for semiconductor devices from engineering testing
AU  - Nichols, Donald K.
AU  - Huebner, Mark A.
AU  - Price, William E.
AU  - Smith, L. S.
AU  - Coss, James R.
PY  - 1988
UR  - https://ntrs.nasa.gov/citations/19890011450
ID  - 19890011450
ER  -