@misc{indiciae0555cc22b97a,
  title = {Temperature control in wafer-level testing of large multi-segment electromigration test structures},
  author = {Zamani, Nasser and Lin, Yu-Sang},
  year = {1988},
  url = {https://ntrs.nasa.gov/citations/19890044957},
  note = {Source identifier: 19890044957}
}