TY  - RPRT
TI  - Characterization of multiple-bit errors from single-ion tracks in integrated circuits
AU  - Zoutendyk, J. A.
AU  - Edmonds, L. D.
AU  - Smith, L. S.
PY  - 1989
UR  - https://ntrs.nasa.gov/citations/19900038489
ID  - 19900038489
ER  -